The datasheet for AM335x talks about support for Device Boundary Scan and IEEE 1500. I'm wondering if the device has any built-in self test (BIST) instrumentation that can be controlled through the ...

Test Data Register (TDR): The access network consists of Test Data Register (TDR), which is similar to, but not the same as those found in JTAG Boundary Scan Standard. TDR has data input ports, si, to ...

This application note describes the JTAG hardware boundary scan chain for the DS26522 dual-port, single-chip transceiver. The DS26522 is composed of two dice, and the JTAG functionality is the same as ...

My questions is as follows: Must I keep the JTAG_NTRST de-asserted for all subsequent boundary scan tests? If JTAG_NTRST is asserted will it ‘kick’ the OMAP out of boundary scan mode meaning I must go ...