Synopsys 3DIO IP Solution (figure 4) is specially tuned for multi-die heterogeneous integration with a versatile offering, ...

Miteshwar M. Patel (ASIC Engineer, eInfochips Ltd) Nirav Nanavati (Tech Lead, eInfochips Ltd) Abstract Design for testability (DFT) and low power issues are very much related with each other. In this ...

The paper describes the design-for-test (DFT) features of a 10.3125Gb/s Serdes and other such high datarate IP as XAUI, PCIe, and others. It is shown that extensive testability can be implemented in a ...

The Federated Hermes MDT stock-selection process utilizes cutting-edge research, technology and daily data from multiple market cycles—conferring the advantages of discipline, testability and ...